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Year Title Metal Oxide Anneal.      
               
2017

Tongji University

China

Ionic transport and barrier effect of anodic oxide layer in a solid-state Al2O3capacitor under high electric field Al

(Evaporation 100 nm)

AmAO (Amorphous Aluminum oxide210 nm)

Sol-Gel, Spin coating

  the cyclic measurement. The cross-sectional FESEM image, Fig. 5d, after the 3 cyclic voltammetric measurements is a strong evidence on the formation of the anodic aluminum oxide (AAO) layer at the Al/AmAO interface. It is suggested that the newly-formed AAO layer inhibited the formation of voids and hillocks in the Al electrode

 

 
2008

Iowa State U.

Device quality low temperature gate oxide growth using electron cyclotron resonance plasma oxidation of silicon Si wafer Plasma Oxidation  

 

  기판에 양의 전압을 가하면 oxidation 이 더 많이 됨